Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1
Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To de...
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doaj-3efe9f680cf840f4a341954af1e08c6d2021-06-07T06:49:02ZengElsevierJournal of Integrative Agriculture2095-31192013-06-0112610181025Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1Dong-fang MA0Jin-xue JING1Dong-yuan HOU2Qiang LI3Xin-li ZHOU4Jiu-yuan DU5Qing-lin LU6State Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100, P.R. ChinaState Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100, P.R. China; Correspondence JING Jin-xue, Tel: +86-29-87092434State Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100, P.R. ChinaState Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100, P.R. ChinaState Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100, P.R. ChinaWheat Research Institute, Gansu Academy of Agricultural Sciences, Lanzhou 730070, P.R. ChinaWheat Research Institute, Gansu Academy of Agricultural Sciences, Lanzhou 730070, P.R. ChinaStripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To determing the gene(s) for the stripe rust resistance, Lantian 1 was crossed with Mingxian 169 (M169). Seedlings of the parents, and F1, F2 and F2-3 progenies were tested with races CYR32 of Pst under controlled greenhouse conditions. Lantian 1 has a single partially dominant gene conferred resistance to race CYR32, designated as YrLT1. Simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrLT1. A linkage group of five SSR markers was constructed for YrLT1 using 166 F2 plants. Based on the SSR marker consensus map and the position on wheat chromosome, the resistance gene was assigned on chromosome 2DL. Amplification of a set of nulli-tetrasomic Chinese Spring lines with SSR marker Xwmc797 confirmed that the resistance gene was located on the long arm of chromosome 2D. Because of its chromosomal location and the high-temperature resistance, this gene is different from previously described genes. The molecular map spanned 29.9 cM, and the genetic distance of two close markers Xbarc228 and Xcfd16 to resistance gene locus was 4.0 and 5.7 cM, respectively. The polymorphism rates of the flanking markers in 46 wheat lines were 2.1 and 2.1%, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 97.9% of tested genotypes. This new gene and flanking markers should be useful in developing wheat cultivars with high level and possible durable resistance to stripe rust.http://www.sciencedirect.com/science/article/pii/S2095311913604797Puccinia striiformis f. sp. triticihigh-temperature resistancegenetic analysismolecular mapping |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Dong-fang MA Jin-xue JING Dong-yuan HOU Qiang LI Xin-li ZHOU Jiu-yuan DU Qing-lin LU |
spellingShingle |
Dong-fang MA Jin-xue JING Dong-yuan HOU Qiang LI Xin-li ZHOU Jiu-yuan DU Qing-lin LU Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 Journal of Integrative Agriculture Puccinia striiformis f. sp. tritici high-temperature resistance genetic analysis molecular mapping |
author_facet |
Dong-fang MA Jin-xue JING Dong-yuan HOU Qiang LI Xin-li ZHOU Jiu-yuan DU Qing-lin LU |
author_sort |
Dong-fang MA |
title |
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 |
title_short |
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 |
title_full |
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 |
title_fullStr |
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 |
title_full_unstemmed |
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian 1 |
title_sort |
genetics and molecular mapping of a high-temperature resistance gene to stripe rust in seeding-stage in winter wheat cultivar lantian 1 |
publisher |
Elsevier |
series |
Journal of Integrative Agriculture |
issn |
2095-3119 |
publishDate |
2013-06-01 |
description |
Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To determing the gene(s) for the stripe rust resistance, Lantian 1 was crossed with Mingxian 169 (M169). Seedlings of the parents, and F1, F2 and F2-3 progenies were tested with races CYR32 of Pst under controlled greenhouse conditions. Lantian 1 has a single partially dominant gene conferred resistance to race CYR32, designated as YrLT1. Simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrLT1. A linkage group of five SSR markers was constructed for YrLT1 using 166 F2 plants. Based on the SSR marker consensus map and the position on wheat chromosome, the resistance gene was assigned on chromosome 2DL. Amplification of a set of nulli-tetrasomic Chinese Spring lines with SSR marker Xwmc797 confirmed that the resistance gene was located on the long arm of chromosome 2D. Because of its chromosomal location and the high-temperature resistance, this gene is different from previously described genes. The molecular map spanned 29.9 cM, and the genetic distance of two close markers Xbarc228 and Xcfd16 to resistance gene locus was 4.0 and 5.7 cM, respectively. The polymorphism rates of the flanking markers in 46 wheat lines were 2.1 and 2.1%, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 97.9% of tested genotypes. This new gene and flanking markers should be useful in developing wheat cultivars with high level and possible durable resistance to stripe rust. |
topic |
Puccinia striiformis f. sp. tritici high-temperature resistance genetic analysis molecular mapping |
url |
http://www.sciencedirect.com/science/article/pii/S2095311913604797 |
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