Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry

Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry

Accurate reference dielectric functions play an important role in the research and development of optical materials. Libraries of such data are required in many applications in which amorphous semiconductors are gaining increasing interest, such as in integrated optics, optoelectronics or photovolta...

Full description

Bibliographic Details
Main Authors: Tivadar Lohner, Edit Szilágyi, Zsolt Zolnai, Attila Németh, Zsolt Fogarassy, Levente Illés, Endre Kótai, Peter Petrik, Miklós Fried
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Coatings
Subjects:
germanium
optical properties
dielectric function
thin film characterization
semiconductor
spectroscopic ellipsometry
Online Access:https://www.mdpi.com/2079-6412/10/5/480

Similar Items

Similar Items