Understanding ordered structure in hematite nanowhiskers synthesized via thermal oxidation of iron-based substrates

Hematite (α-Fe2O3) nanowhiskers (NWs) with (001) basal faces synthesized via thermal oxidation of iron-based substrates are known to contain an ordered structure. The ordered structure has been identified to be related to oxygen vacancy ordering. However, the cause of its formation remains a mystery...

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Bibliographic Details
Main Authors: Ming-Wei Lai, Hiroki Kurata
Format: Article
Language:English
Published: Elsevier 2020-06-01
Series:Materials & Design
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S0264127520301301
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Summary:Hematite (α-Fe2O3) nanowhiskers (NWs) with (001) basal faces synthesized via thermal oxidation of iron-based substrates are known to contain an ordered structure. The ordered structure has been identified to be related to oxygen vacancy ordering. However, the cause of its formation remains a mystery. In this study, with a high-resolution transmission electron microscopy (HR-TEM) investigation based on negative-Cs imaging (NCSI) and atomic-column position analysis, we observed tensile strain in the above-mentioned α-Fe2O3 NWs and revealed that the ordered structure was actually periodic interplanar gap expansions induced by oxygen vacancy accumulations. These findings were further confirmed in a monochromated electron energy loss spectroscopy (EELS) analysis of the α-Fe2O3 NWs. The EELS data indicated that, in comparison to pristine α-Fe2O3, the α-Fe2O3 NWs possessed expanded average FeO and OO interatomic distances and were oxygen-deficient. Clarifying oxygen deficiency in the α-Fe2O3 NWs was not attributed to an insufficient oxygen supply during the NW growth, we concluded the ordered structure formed to accommodate tensile strain in the α-Fe2O3 NWs. This work demonstrates the applicability of integrating NCSI and monochromated EELS for the examination of strain-induced microstructural and microchemical variations in lightly strained metal oxides.
ISSN:0264-1275