An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractiv...
Main Authors: | Tiryaki Erhan, Kocahan Özlem, Özder Serhat |
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Format: | Article |
Language: | English |
Published: |
Sciendo
2021-04-01
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Series: | Measurement Science Review |
Subjects: | |
Online Access: | https://doi.org/10.2478/msr-2021-0009 |
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