Determination of distribution function of refraction index and anion diffusion depth in porous alumina photonic crystals

  Band structure of porous alumina photonic crystal in the Γ X direction was calculated using order-N method . In a comparison of calculated results with experimental data of reflective and absorptive index, the variation of refractive index of alumina in the external region of oxide layer, around t...

Full description

Bibliographic Details
Main Authors: H. Kaviani, A. Ramazani, M. Almasi Kashi
Format: Article
Language:English
Published: Isfahan University of Technology 2007-09-01
Series:Iranian Journal of Physics Research
Subjects:
Online Access:http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-113&slc_lang=en&sid=1
Description
Summary:  Band structure of porous alumina photonic crystal in the Γ X direction was calculated using order-N method . In a comparison of calculated results with experimental data of reflective and absorptive index, the variation of refractive index of alumina in the external region of oxide layer, around the pores were studied. A Gaussian distribution function was adopted for phosphate anions in the external oxide layer and the variation of refractive index and diffusion depth were determined. The structure of the first four bands was calculated using the obtained distribution of refractive index in the external oxide layer for both TE and TM mode. This results show a narrow full band gap in the TM mode.
ISSN:1682-6957