Accurate localization microscopy by intrinsic aberration calibration
The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.
Main Authors: | Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, Samuel M. Stavis |
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Format: | Article |
Language: | English |
Published: |
Nature Publishing Group
2021-06-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-021-23419-y |
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