Preparation of high-resolution magnetic force microscope tips coated with Co and FeCo films
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with Co and Fe65Co35 (at. %) films by employing an ultra-high vacuum evaporation system. The effect of coating film thickness on MFM spatial resolution is investigated. With increasing the thickness from 10 to 20 nm,...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20134001002 |