Low Cost Test Pattern Generation in Scan-Based BIST Schemes
This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input c...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-03-01
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Series: | Electronics |
Subjects: | |
Online Access: | http://www.mdpi.com/2079-9292/8/3/314 |
Summary: | This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS’89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage. |
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ISSN: | 2079-9292 |