Low Cost Test Pattern Generation in Scan-Based BIST Schemes

Low Cost Test Pattern Generation in Scan-Based BIST Schemes

This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input c...

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Bibliographic Details
Main Authors: Guohe Zhang, Ye Yuan, Feng Liang, Sufen Wei, Cheng-Fu Yang
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Electronics
Subjects:
test pattern generation
built-in self-test
broadcast circuit
low cost
Online Access:http://www.mdpi.com/2079-9292/8/3/314
id doaj-5f270b599535481b9ce00ad11a092f6a
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spelling doaj-5f270b599535481b9ce00ad11a092f6a2020-11-24T21:54:42ZengMDPI AGElectronics2079-92922019-03-018331410.3390/electronics8030314electronics8030314Low Cost Test Pattern Generation in Scan-Based BIST SchemesGuohe Zhang0Ye Yuan1Feng Liang2Sufen Wei3Cheng-Fu Yang4School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaDepartment of Chemical and Materials Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu District, Kaohsiung 811, TaiwanThis paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS’89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage.http://www.mdpi.com/2079-9292/8/3/314test pattern generationbuilt-in self-testbroadcast circuitlow cost
collection DOAJ
language English
format Article
sources DOAJ
author Guohe Zhang
Ye Yuan
Feng Liang
Sufen Wei
Cheng-Fu Yang
spellingShingle Guohe Zhang
Ye Yuan
Feng Liang
Sufen Wei
Cheng-Fu Yang
Low Cost Test Pattern Generation in Scan-Based BIST Schemes
Electronics
test pattern generation
built-in self-test
broadcast circuit
low cost
author_facet Guohe Zhang
Ye Yuan
Feng Liang
Sufen Wei
Cheng-Fu Yang
author_sort Guohe Zhang
title Low Cost Test Pattern Generation in Scan-Based BIST Schemes
title_short Low Cost Test Pattern Generation in Scan-Based BIST Schemes
title_full Low Cost Test Pattern Generation in Scan-Based BIST Schemes
title_fullStr Low Cost Test Pattern Generation in Scan-Based BIST Schemes
title_full_unstemmed Low Cost Test Pattern Generation in Scan-Based BIST Schemes
title_sort low cost test pattern generation in scan-based bist schemes
publisher MDPI AG
series Electronics
issn 2079-9292
publishDate 2019-03-01
description This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS’89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage.
topic test pattern generation
built-in self-test
broadcast circuit
low cost
url http://www.mdpi.com/2079-9292/8/3/314
work_keys_str_mv AT guohezhang lowcosttestpatterngenerationinscanbasedbistschemes
AT yeyuan lowcosttestpatterngenerationinscanbasedbistschemes
AT fengliang lowcosttestpatterngenerationinscanbasedbistschemes
AT sufenwei lowcosttestpatterngenerationinscanbasedbistschemes
AT chengfuyang lowcosttestpatterngenerationinscanbasedbistschemes
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