Non-conventional mechanism of ferroelectric fatigue via cation migration

Non-conventional mechanism of ferroelectric fatigue via cation migration

Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the fil...

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Bibliographic Details
Main Authors: Anton V. Ievlev, Santosh KC, Rama K. Vasudevan, Yunseok Kim, Xiaoli Lu, Marin Alexe, Valentino R. Cooper, Sergei V. Kalinin, Olga S. Ovchinnikova
Format: Article
Language:English
Published: Nature Publishing Group 2019-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-019-11089-w
Description
Summary:Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the film structure.
ISSN:2041-1723

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