Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve

This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permi...

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Main Authors:	P. H. B. Cavalcanti Filho, J. A. I. Araujo, M. R. T. Oliveira, M. T. de Melo, M. S. Coutinho, L. M. da Silva, I. Llamas-Garro
Format:	Article
Language:	English
Published:	Hindawi Limited 2020-01-01
Series:	Journal of Sensors
Online Access:	http://dx.doi.org/10.1155/2020/8830596

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spelling	doaj-65aa856f5e604e11818f98e59b5ccfd22020-12-14T09:46:38ZengHindawi LimitedJournal of Sensors1687-725X1687-72682020-01-01202010.1155/2020/88305968830596Planar Sensor for Material Characterization Based on the Sierpinski Fractal CurveP. H. B. Cavalcanti Filho0J. A. I. Araujo1M. R. T. Oliveira2M. T. de Melo3M. S. Coutinho4L. M. da Silva5I. Llamas-Garro6Departamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilCentre Tecnològic de Telecomunicacions de Catalunya (CTTC/CERCA), Castelldefels, Barcelona, SpainThis paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results.http://dx.doi.org/10.1155/2020/8830596
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro
spellingShingle	P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve Journal of Sensors
author_facet	P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro
author_sort	P. H. B. Cavalcanti Filho
title	Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
title_short	Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
title_full	Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
title_fullStr	Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
title_full_unstemmed	Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
title_sort	planar sensor for material characterization based on the sierpinski fractal curve
publisher	Hindawi Limited
series	Journal of Sensors
issn	1687-725X 1687-7268
publishDate	2020-01-01
description	This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results.
url	http://dx.doi.org/10.1155/2020/8830596
work_keys_str_mv	AT phbcavalcantifilho planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT jaiaraujo planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT mrtoliveira planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT mtdemelo planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT mscoutinho planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT lmdasilva planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve AT illamasgarro planarsensorformaterialcharacterizationbasedonthesierpinskifractalcurve
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Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve

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