Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve
This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permi...
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Series: | Journal of Sensors |
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doaj-65aa856f5e604e11818f98e59b5ccfd22020-12-14T09:46:38ZengHindawi LimitedJournal of Sensors1687-725X1687-72682020-01-01202010.1155/2020/88305968830596Planar Sensor for Material Characterization Based on the Sierpinski Fractal CurveP. H. B. Cavalcanti Filho0J. A. I. Araujo1M. R. T. Oliveira2M. T. de Melo3M. S. Coutinho4L. M. da Silva5I. Llamas-Garro6Departamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilDepartamento de Eletronica e Sistemas, Universidade Federal de Pernambuco (UFPE), Recife, BrazilCentre Tecnològic de Telecomunicacions de Catalunya (CTTC/CERCA), Castelldefels, Barcelona, SpainThis paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results.http://dx.doi.org/10.1155/2020/8830596 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro |
spellingShingle |
P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve Journal of Sensors |
author_facet |
P. H. B. Cavalcanti Filho J. A. I. Araujo M. R. T. Oliveira M. T. de Melo M. S. Coutinho L. M. da Silva I. Llamas-Garro |
author_sort |
P. H. B. Cavalcanti Filho |
title |
Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve |
title_short |
Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve |
title_full |
Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve |
title_fullStr |
Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve |
title_full_unstemmed |
Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve |
title_sort |
planar sensor for material characterization based on the sierpinski fractal curve |
publisher |
Hindawi Limited |
series |
Journal of Sensors |
issn |
1687-725X 1687-7268 |
publishDate |
2020-01-01 |
description |
This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results. |
url |
http://dx.doi.org/10.1155/2020/8830596 |
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