SRAM based FPGA system capable of runtime fault tolerance and recovery

In order to enhance the reliability of electronic system working in radiation environment, a reliability enhanced SRAM based FPGA system with runtime fault recovery is presented in this work. Coarse-grained TMR architecture and fine-grained TMR architecture are proposed to achieve the ability of fau...

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Bibliographic Details
Main Authors: Xu Weijie, Xie Yongle, Peng Libiao, Shen Beichen
Format: Article
Language:zho
Published: National Computer System Engineering Research Institute of China 2019-07-01
Series:Dianzi Jishu Yingyong
Subjects:
tmr
Online Access:http://www.chinaaet.com/article/3000106098
Description
Summary:In order to enhance the reliability of electronic system working in radiation environment, a reliability enhanced SRAM based FPGA system with runtime fault recovery is presented in this work. Coarse-grained TMR architecture and fine-grained TMR architecture are proposed to achieve the ability of fault tolerance. Fine-grained fault detection units are inserted in each redundancy module to mask the faulty module. The technique of partial dynamic reconfiguration is used to repair the faulty module without interrupting other parts of the system。The scheme is implemented in Xilinx Virtex-6 FPGA, and the results show that the improvements in recovery time and reliability are achieved by the proposed technique.
ISSN:0258-7998