Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon

Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon

We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measure...

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Bibliographic Details
Main Authors: V. Yurchenko, T. S. Navruz, M. Ciydem, A. Altintas
Format: Article
Language:English
Published: Advanced Electromagnetics 2019-05-01
Series:Advanced Electromagnetics
Subjects:
Microwave
Whispering Gallery Mode
Photoconductivity
Recombination
Silicon
Online Access:https://aemjournal.org/index.php/AEM/article/view/1127
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spelling doaj-67a05492d57b45fb9b1cbc32b1b793872020-11-24T21:55:24ZengAdvanced ElectromagneticsAdvanced Electromagnetics2119-02752019-05-018210110710.7716/aem.v8i2.11271127Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in SiliconV. Yurchenko0T. S. Navruz1M. Ciydem2A. Altintas3Gazi UniversityGazi UniversityEngitek Engineering Technologies LtdBilkent UniversityWe present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.https://aemjournal.org/index.php/AEM/article/view/1127MicrowaveWhispering Gallery ModePhotoconductivityRecombinationSilicon
collection DOAJ
language English
format Article
sources DOAJ
author V. Yurchenko
T. S. Navruz
M. Ciydem
A. Altintas
spellingShingle V. Yurchenko
T. S. Navruz
M. Ciydem
A. Altintas
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
Advanced Electromagnetics
Microwave
Whispering Gallery Mode
Photoconductivity
Recombination
Silicon
author_facet V. Yurchenko
T. S. Navruz
M. Ciydem
A. Altintas
author_sort V. Yurchenko
title Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
title_short Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
title_full Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
title_fullStr Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
title_full_unstemmed Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
title_sort microwave whispering-gallery-mode photoconductivity measurement of recombination lifetime in silicon
publisher Advanced Electromagnetics
series Advanced Electromagnetics
issn 2119-0275
publishDate 2019-05-01
description We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.
topic Microwave
Whispering Gallery Mode
Photoconductivity
Recombination
Silicon
url https://aemjournal.org/index.php/AEM/article/view/1127
work_keys_str_mv AT vyurchenko microwavewhisperinggallerymodephotoconductivitymeasurementofrecombinationlifetimeinsilicon
AT tsnavruz microwavewhisperinggallerymodephotoconductivitymeasurementofrecombinationlifetimeinsilicon
AT mciydem microwavewhisperinggallerymodephotoconductivitymeasurementofrecombinationlifetimeinsilicon
AT aaltintas microwavewhisperinggallerymodephotoconductivitymeasurementofrecombinationlifetimeinsilicon
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