Low-Power, Subthreshold Reference Circuits for the Space Environment: Evaluated with <i>γ</i>-rays, X-rays, Protons and Heavy Ions

Low-Power, Subthreshold Reference Circuits for the Space Environment: Evaluated with <i>γ</i>-rays, X-rays, Protons and Heavy Ions

The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under <inline-formula> <math display="inline"> <s...

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Bibliographic Details
Main Authors: Charalambos M. Andreou, Diego Miguel González-Castaño, Simone Gerardin, Marta Bagatin, Faustino Gómez Rodriguez, Alessandro Paccagnella, Alexander V. Prokofiev, Arto Javanainen, Ari Virtanen, Valentino Liberali, Cristiano Calligaro, Daniel Nahmad, Julius Georgiou
Format: Article
Language:English
Published: MDPI AG 2019-05-01
Series:Electronics
Subjects:
analog single-event transient (ASET)
bandgap voltage reference (BGR)
CMOS analog integrated circuits
gamma-rays
heavy-ions
ionization
protons
radiation hardening by design (RHBD)
reference circuits
single-event effects (SEE)
space electronics
total ionization dose (TID)
voltage reference
X-rays
Online Access:https://www.mdpi.com/2079-9292/8/5/562

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