Characterization and Modeling of 0.18<italic>μ</italic>m Bulk CMOS Technology at Sub-Kelvin Temperature
Previous cryogenic electronics studies are mostly at 77K and 4.2K. Cryogenic characterization of a 0.18μm standard bulk CMOS technology (operating voltages: 1.8V and 5V) is presented in this paper. Several NMOS and PMOS devices with different width to length ratios (W/L) were extensively...
Main Authors: | Teng-Teng Lu, Zhen Li, Chao Luo, Jun Xu, Weicheng Kong, Guoping Guo |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Journal of the Electron Devices Society |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9163160/ |
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