An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration

SiC MOSFETs have an excellent characteristic of high switching speed, which can improve the efficiency and power density of converters significantly. However, the fast switching processes of SiC MOSFETs cause serious crosstalk problems in bridge-arm configurations, which restricts the devices’ perfo...

Full description

Bibliographic Details
Main Authors: Dakang Yuan, Yiming Zhang, Xuhong Wang
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/14/3/683
id doaj-7a41b5a382004f57a462e7120fde1aa1
record_format Article
spelling doaj-7a41b5a382004f57a462e7120fde1aa12021-01-29T00:07:40ZengMDPI AGEnergies1996-10732021-01-011468368310.3390/en14030683An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm ConfigurationDakang Yuan0Yiming Zhang1Xuhong Wang2Electromagnetic Theory and New Technology Laboratory, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, ChinaElectromagnetic Theory and New Technology Laboratory, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, ChinaElectromagnetic Theory and New Technology Laboratory, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, ChinaSiC MOSFETs have an excellent characteristic of high switching speed, which can improve the efficiency and power density of converters significantly. However, the fast switching processes of SiC MOSFETs cause serious crosstalk problems in bridge-arm configurations, which restricts the devices’ performances. This paper presents a detailed and accurate improved crosstalk analytical model, which takes into account the nonlinear capacitances, the parasitic inductances, the reverse recovery characteristics of the anti-parallel diodes, and the nonlinear voltage switching and damping oscillation process. The novelty of the proposed model lies in the fact that under the condition of comprehensively considering all these non-ideal factors of the bridge-arm, the effects of multi-parasitic elements and multi-variables coupling to the crosstalk are hierarchically divided. The parasitic elements and their correlations are described in detail and the direct and indirect variables’ impacts are clearly traced. Thus, according to the different variables switching stages, the influence processes of these parasitic elements and variables can be integrated and a complete equivalent analytical model of the crosstalk process can be derived. The simulation and experiment platforms are established and a series of experimental verifications and comparisons prove that the model can replicate experimental measurements of crosstalk with good accuracy and detail.https://www.mdpi.com/1996-1073/14/3/683analytical modelcrosstalkSiC MOSFETsbridge-arm
collection DOAJ
language English
format Article
sources DOAJ
author Dakang Yuan
Yiming Zhang
Xuhong Wang
spellingShingle Dakang Yuan
Yiming Zhang
Xuhong Wang
An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
Energies
analytical model
crosstalk
SiC MOSFETs
bridge-arm
author_facet Dakang Yuan
Yiming Zhang
Xuhong Wang
author_sort Dakang Yuan
title An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
title_short An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
title_full An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
title_fullStr An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
title_full_unstemmed An Improved Analytical Model for Crosstalk of SiC MOSFET in a Bridge-Arm Configuration
title_sort improved analytical model for crosstalk of sic mosfet in a bridge-arm configuration
publisher MDPI AG
series Energies
issn 1996-1073
publishDate 2021-01-01
description SiC MOSFETs have an excellent characteristic of high switching speed, which can improve the efficiency and power density of converters significantly. However, the fast switching processes of SiC MOSFETs cause serious crosstalk problems in bridge-arm configurations, which restricts the devices’ performances. This paper presents a detailed and accurate improved crosstalk analytical model, which takes into account the nonlinear capacitances, the parasitic inductances, the reverse recovery characteristics of the anti-parallel diodes, and the nonlinear voltage switching and damping oscillation process. The novelty of the proposed model lies in the fact that under the condition of comprehensively considering all these non-ideal factors of the bridge-arm, the effects of multi-parasitic elements and multi-variables coupling to the crosstalk are hierarchically divided. The parasitic elements and their correlations are described in detail and the direct and indirect variables’ impacts are clearly traced. Thus, according to the different variables switching stages, the influence processes of these parasitic elements and variables can be integrated and a complete equivalent analytical model of the crosstalk process can be derived. The simulation and experiment platforms are established and a series of experimental verifications and comparisons prove that the model can replicate experimental measurements of crosstalk with good accuracy and detail.
topic analytical model
crosstalk
SiC MOSFETs
bridge-arm
url https://www.mdpi.com/1996-1073/14/3/683
work_keys_str_mv AT dakangyuan animprovedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
AT yimingzhang animprovedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
AT xuhongwang animprovedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
AT dakangyuan improvedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
AT yimingzhang improvedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
AT xuhongwang improvedanalyticalmodelforcrosstalkofsicmosfetinabridgearmconfiguration
_version_ 1724319063738417152