Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF
Nanometric thin films have always been chiefly used for decoration; however they are now being widely used as the basis of high technology. Among the various physical qualities that characterize them, the thickness strongly influences their properties. Thus, a new procedure is hereby proposed and de...
Main Authors: | , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2016-01-01
|
Series: | Journal of Spectroscopy |
Online Access: | http://dx.doi.org/10.1155/2016/9509043 |