A New Read Scheme for Alleviating Cell-to-Cell Interference in Scaled-Down 3D NAND Flash Memory

In this paper, we investigated the cell-to-cell interference in scaled-down 3D NAND flash memory by using a Technology Computer-Aided Design (TCAD) simulation. The fundamental cause of cell-to-cell interference is that the electric field crowding point is changed by the programmed adjacent cell so t...

Full description

Bibliographic Details
Main Authors: Jae-Min Sim, Myounggon Kang, Yun-Heub Song
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/9/11/1775