Analysis of surface roughness and three-dimensional scanning topography of zirconia implants before and after photofunctionalization by atomic force microscopy: An In Vitro study

• Main Authors: R Arun Jaikumar, Suma Karthigeyan, T R Ramesh Bhat, Madhulika Naidu, G R Praveen Raj, Senthil Natarajan
• Format: Article
• Language: English
• Published: Wolters Kluwer Medknow Publications 2021-01-01
• Series: Journal of Pharmacy and Bioallied Sciences
• Subjects: atomic force microscopy; implants; photofunctionalization; roughness parameters; surface topography
• Online Access: http://www.jpbsonline.org/article.asp?issn=0975-7406;year=2021;volume=13;issue=5;spage=766;epage=771;aulast=Jaikumar

Aim: To analyze surface roughness and three-dimensional (3D) scanning topography parameters of zirconia implants before and after photofunctionalization by atomic force microscopy (AFM). Materials and Methods: Ten commercially available zirconia implants five each in the study and control group were taken. The study group was subjected to ultraviolet (UV) radiation for 48 h using the shorter wavelength of 254 nm. After washing all the implants with 70% alcohol and drying, 3D surface topography and roughness parameters were analyzed using CSC 17 probe AFM at three different magnifications 25 μm, 50 μm, and 80 μm, respectively. Results: The surface topography and calculated mean amplitude, spatial, and hybrid parameters of the study group were higher than the control group (P < 0.05) in all three magnifications. Up to scale depth and peak value for the study and control group were (−0.4–0.4: −2-1) (−0.75 to 0.6:−1–1.3) (−0.75-−0.5: −1.5-1.3) for the study and control group at 25, 50, and 80 μm magnification, respectively. This indicates that photofunctionalization increased surface roughness of Zirconia implants to desirable extent. Conclusion: There is a definite difference in the quantitative topographic characteristics with zirconia implants being microroughned after photofunctionalization (UV treatment).