A Review on IGBT Module Failure Modes and Lifetime Testing
This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. T...
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2021-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/9316255/ |
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doaj-7d664cf98cf0480caee5b957a48893d12021-03-30T15:21:34ZengIEEEIEEE Access2169-35362021-01-0199643966310.1109/ACCESS.2021.30497389316255A Review on IGBT Module Failure Modes and Lifetime TestingAhmed Abuelnaga0https://orcid.org/0000-0002-2329-377XMehdi Narimani1https://orcid.org/0000-0003-3399-397XAmir Sajjad Bahman2Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, CanadaDepartment of Electrical and Computer Engineering, McMaster University, Hamilton, ON, CanadaCenter of Reliable Power Electronics (CORPE), Aalborg University, Aalborg, DenmarkThis article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details.https://ieeexplore.ieee.org/document/9316255/Long-term reliabilityIGBT failure modespower cyclinglifetime modelsdegradation |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Ahmed Abuelnaga Mehdi Narimani Amir Sajjad Bahman |
| spellingShingle |
Ahmed Abuelnaga Mehdi Narimani Amir Sajjad Bahman A Review on IGBT Module Failure Modes and Lifetime Testing IEEE Access Long-term reliability IGBT failure modes power cycling lifetime models degradation |
| author_facet |
Ahmed Abuelnaga Mehdi Narimani Amir Sajjad Bahman |
| author_sort |
Ahmed Abuelnaga |
| title |
A Review on IGBT Module Failure Modes and Lifetime Testing |
| title_short |
A Review on IGBT Module Failure Modes and Lifetime Testing |
| title_full |
A Review on IGBT Module Failure Modes and Lifetime Testing |
| title_fullStr |
A Review on IGBT Module Failure Modes and Lifetime Testing |
| title_full_unstemmed |
A Review on IGBT Module Failure Modes and Lifetime Testing |
| title_sort |
review on igbt module failure modes and lifetime testing |
| publisher |
IEEE |
| series |
IEEE Access |
| issn |
2169-3536 |
| publishDate |
2021-01-01 |
| description |
This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details. |
| topic |
Long-term reliability IGBT failure modes power cycling lifetime models degradation |
| url |
https://ieeexplore.ieee.org/document/9316255/ |
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