Spectroscopic ellipsometry for active nano- and meta-materials
Spectroscopic ellipsometry (SE) is a powerful technique for the characterization of materials, which is able to probe in a sensitive way their nanostructure as well as to get rich information about their dielectric properties, through the interaction of polarized light with matter. In the present tr...
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| Format: | Article |
| Language: | English |
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De Gruyter
2014-06-01
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| Series: | Nanotechnology Reviews |
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| Online Access: | https://doi.org/10.1515/ntrev-2013-0043 |