Lineal Energy of Proton in Silicon by a Microdosimetry Simulation
Single event upset, or Single Event Effect (SEE) is increasingly important as semiconductor devices are entering into nano-meter scale. The Linear Energy Transfer (LET) concept is commonly used to estimate the rate of SEE. The SEE, however, should be related to energy deposition of each stochastic e...
Main Authors: | Yueh Chiang, Cher Ming Tan, Chuan-Jong Tung, Chung-Chi Lee, Tsi-Chian Chao |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-01-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/11/3/1113 |
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