Back-streaming ion emission and beam focusing on high power linear induction accelerator

• Main Authors: Jun Zhu, Nan Chen, Haijun Yu, Xiaoguo Jiang, Yuan Wang, Wenhua Dai, Feng Gao, Minhong Wang, Jin Li, Jinshui Shi
• Format: Article
• Language: English
• Published: American Physical Society 2011-08-01
• Series: Physical Review Special Topics. Accelerators and Beams
• Online Access: http://doi.org/10.1103/PhysRevSTAB.14.082801

Ions released from target surfaces by impact of a high intensity and current electron beam can be accelerated and trapped in the beam potential, and further destroy the beam focus. By solving the 2D Poisson equation, we found that the charge neutralization factor of the ions to the beam under space charge limited condition is 1/3, which is large enough to disrupt the spot size. Therefore, the ion emission at the target in a single-pulse beam/target system must be source limited. Experimental results on the time-resolved beam profile measurement have also proven that. A new focus scheme is proposed in this paper to focus the beam to a small spot size with the existence of back-streaming ions. We found that the focal spot will move upstream as the charge neutralization factor increases. By comparing the theoretical and experimental focal length of the Dragon-I accelerator (20 MeV, 2.5 kA, 60 ns flattop), we found that the average neutralization factor is about 5% in the beam/target system.