APA (7th ed.) Citation

Park, Y. M., Park, J. S., Chung, C., & Lee, S. (2020). High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method. Elsevier.

Chicago Style (17th ed.) Citation

Park, Young Min, Joon Sik Park, Choong-Heui Chung, and Sangyeob Lee. High Resolution Atomic Force and Kelvin Probe Force Microscopy Image Data of InAs(001) Surface Using Frequency Modulation Method. Elsevier, 2020.

MLA (8th ed.) Citation

Park, Young Min, et al. High Resolution Atomic Force and Kelvin Probe Force Microscopy Image Data of InAs(001) Surface Using Frequency Modulation Method. Elsevier, 2020.