| Summary: | Abstract Surface charges accumulated on solid insulating materials in electrical apparatuses and electronic devices could distort the initial electric field and severely damage the insulation performance. Accurate transient surface charge measurement is critical to determine the mechanisms of charge transport and flashover occurrence, and estimate surface insulation strength under high voltage. The measurement technique based on the Pockels electro‐optic effect is considered as the only approach for 2‐D dynamic charge distribution behaviour so far, and it has good capability to avoid original electric field distortion caused by conventional methods featured by metal probes. This paper reviews recent progress of the non‐invasive dynamic surface charge measurement systems on the Pockels technique. We focus especially on typical systems with transmitting and reflecting configurations and the frequently used fast inversion algorithms. It can be inferred that higher spatial‐temporal resolution, higher signal‐to‐noise ratio, and better compatibility for both transparent and opaque materials are the future development trends, which greatly depend on multiple technological breakthroughs at impact‐resistant electro‐optic crystals, advanced high‐speed photography and high‐performance inversion algorithms. In addition, the recent studies on transient behaviour of surface discharge, together with the present limitation and future prospects are discussed. It is expected that more ideas will be inspired in transient surface charge measurement by the Pockels technique and other relevant electro‐optic methods.
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