Focused Kerr measurements on patterned arrays of exchange biased square dots

• Main Authors: Vinai G., Moritz J., Gaudin G., Vogel J., Prejbeanu I.L., Dieny B.
• Format: Article
• Language: English
• Published: EDP Sciences 2014-07-01
• Series: EPJ Web of Conferences
• Online Access: http://dx.doi.org/10.1051/epjconf/20147505003

Microstructural effects on the antiferromagnetic layer were investigated on IrMn/Co exchange biased square dots. IrMn grain size and distributions were tuned by changing Cu buffer layer or IrMn thicknesses. Lateral dimensions from 200 to 50nm were varied. Exchange bias (Hex) variability was analysed through focused Kerr measurements on small groups of dots. Patterned samples presented average exchange bias values following the trends and values of full sheet samples. Concerning the dot to dot behaviour, it resulted that IrMn microstructure variations have minor effects on Hex variability, because no particular trend is observed as a function of grain size and distribution. The variability is attributed to geometry variation and Co intrinsic variability.