Focused Kerr measurements on patterned arrays of exchange biased square dots
Microstructural effects on the antiferromagnetic layer were investigated on IrMn/Co exchange biased square dots. IrMn grain size and distributions were tuned by changing Cu buffer layer or IrMn thicknesses. Lateral dimensions from 200 to 50nm were varied. Exchange bias (Hex) variability was analyse...
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2014-07-01
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Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/20147505003 |
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doaj-8762ee1cdacc44268022c0d6df8b4b1b2021-08-02T04:24:34ZengEDP SciencesEPJ Web of Conferences2100-014X2014-07-01750500310.1051/epjconf/20147505003epjconf_jems2014_05003Focused Kerr measurements on patterned arrays of exchange biased square dotsVinai G.Moritz J.0Gaudin G.1Vogel J.2Prejbeanu I.L.3Dieny B.4SPINTEC, CEA/CNRS/UJF/Grenoble-INP; CEA/INACSPINTEC, CEA/CNRS/UJF/Grenoble-INP; CEA/INACInstitut Néel, CNRS and UJFSPINTEC, CEA/CNRS/UJF/Grenoble-INP; CEA/INACSPINTEC, CEA/CNRS/UJF/Grenoble-INP; CEA/INAC Microstructural effects on the antiferromagnetic layer were investigated on IrMn/Co exchange biased square dots. IrMn grain size and distributions were tuned by changing Cu buffer layer or IrMn thicknesses. Lateral dimensions from 200 to 50nm were varied. Exchange bias (Hex) variability was analysed through focused Kerr measurements on small groups of dots. Patterned samples presented average exchange bias values following the trends and values of full sheet samples. Concerning the dot to dot behaviour, it resulted that IrMn microstructure variations have minor effects on Hex variability, because no particular trend is observed as a function of grain size and distribution. The variability is attributed to geometry variation and Co intrinsic variability. http://dx.doi.org/10.1051/epjconf/20147505003 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Vinai G. Moritz J. Gaudin G. Vogel J. Prejbeanu I.L. Dieny B. |
spellingShingle |
Vinai G. Moritz J. Gaudin G. Vogel J. Prejbeanu I.L. Dieny B. Focused Kerr measurements on patterned arrays of exchange biased square dots EPJ Web of Conferences |
author_facet |
Vinai G. Moritz J. Gaudin G. Vogel J. Prejbeanu I.L. Dieny B. |
author_sort |
Vinai G. |
title |
Focused Kerr measurements on patterned arrays of exchange biased square dots |
title_short |
Focused Kerr measurements on patterned arrays of exchange biased square dots |
title_full |
Focused Kerr measurements on patterned arrays of exchange biased square dots |
title_fullStr |
Focused Kerr measurements on patterned arrays of exchange biased square dots |
title_full_unstemmed |
Focused Kerr measurements on patterned arrays of exchange biased square dots |
title_sort |
focused kerr measurements on patterned arrays of exchange biased square dots |
publisher |
EDP Sciences |
series |
EPJ Web of Conferences |
issn |
2100-014X |
publishDate |
2014-07-01 |
description |
Microstructural effects on the antiferromagnetic layer were investigated on IrMn/Co exchange biased square dots. IrMn grain size and distributions were tuned by changing Cu buffer layer or IrMn thicknesses. Lateral dimensions from 200 to 50nm were varied. Exchange bias (Hex) variability was analysed through focused Kerr measurements on small groups of dots. Patterned samples presented average exchange bias values following the trends and values of full sheet samples. Concerning the dot to dot behaviour, it resulted that IrMn microstructure variations have minor effects on Hex variability, because no particular trend is observed as a function of grain size and distribution. The variability is attributed to geometry variation and Co intrinsic variability.
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url |
http://dx.doi.org/10.1051/epjconf/20147505003 |
work_keys_str_mv |
AT vinaig focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots AT moritzj focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots AT gauding focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots AT vogelj focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots AT prejbeanuil focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots AT dienyb focusedkerrmeasurementsonpatternedarraysofexchangebiasedsquaredots |
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1721242385791320064 |