A Uniform Eddy Current Probe with a Double-Excitation Coil for Flaw Detection on Aluminium Plates
In this present study, a new uniform eddy current (UEC) probe with a double-excitation coil and pancake orientation is proposed. It is confirmed that the probe generates a strong magnetic field induction that increases the intensity of uniform eddy currents; moreover, it is found to be more efficien...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-10-01
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Series: | Metals |
Subjects: | |
Online Access: | https://www.mdpi.com/2075-4701/9/10/1116 |
Summary: | In this present study, a new uniform eddy current (UEC) probe with a double-excitation coil and pancake orientation is proposed. It is confirmed that the probe generates a strong magnetic field induction that increases the intensity of uniform eddy currents; moreover, it is found to be more efficient in power consumption for excitation using a finite element simulation. Experiments are performed to detect different flaw lengths and depths on an aluminium plate. The flaw signal detected by the probe indicates a high signal-to-noise ratio and increases as a function of flaw depth. The quantitative evaluation of flaws with the proposed UEC probe is achieved based on experimental results. |
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ISSN: | 2075-4701 |