Sequential Shift Absolute Phase Aberration Calibration in Digital Holographic Phase Imaging Based on Chebyshev Polynomials Fitting

We propose a novel absolute calibrate method for digital holographic microscopy with the sequential shift method using Chebyshev polynomials. We separate the object phase and the aberrations by sequential shifting the sample twice in vertical plane of the optical axis. The aberrations phase is then...

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Bibliographic Details
Main Authors: Weilin He, Jiantai Dou, Zhongming Yang, Zhenhua Liu, Zhaojun Liu
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8896944/