A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires

A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires

We report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nanowires, grown through a hydrothermal growth process on nanostructured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively....

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Main Authors: M. Lučić Lavčević, P. Dubček, S. Bernstorff, M. Pavlović, L. Šilović
Format: Article
Language:English
Published: Hindawi Limited 2013-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2013/381519
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spelling doaj-8aaafa2fb9404657b2f96f8707f4b4ac2020-11-24T22:51:23ZengHindawi LimitedJournal of Nanomaterials1687-41101687-41292013-01-01201310.1155/2013/381519381519A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO NanowiresM. Lučić Lavčević0P. Dubček1S. Bernstorff2M. Pavlović3L. Šilović4Department of Physics, Faculty of Chemistry and Technology, University of Split, Teslina 10, 21000 Split, CroatiaDivision of Materials Physics, Division of Laser and Atomic R&D, Ruđer Bošković Institute, Bijenička 54, 10000 Zagreb, CroatiaSAXS Beamline, Elettra-Sincrotrone Trieste S.C.p.A., Strada Statale 14-km 163, 5 in AREA Science Park, 34149 Basovizza, ItalyDivision of Materials Physics, Division of Laser and Atomic R&D, Ruđer Bošković Institute, Bijenička 54, 10000 Zagreb, CroatiaDepartment of Physics, Faculty of Chemistry and Technology, University of Split, Teslina 10, 21000 Split, CroatiaWe report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nanowires, grown through a hydrothermal growth process on nanostructured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively. The comparison of the scattering patterns of seeding coatings and nanowires showed that the scattering of vertically aligned nanowires exhibited a specific feature: the dominant characteristic of their scattering patterns is the appearance of fine structure effects around the specular peak. These effects were clarified by the combined reflection and scattering phenomena, suggested for the aligned nanowires-substrate system. Furthermore, they enabled the calculation of the average gyration radius of nanowires in horizontal direction. The calculated value was in good agreement with the radii of nanowires estimated by surface electron microscopy. Therefore, the observed feature in the scattering pattern can serve as evidence of the aligned growth of nanowires.http://dx.doi.org/10.1155/2013/381519
collection DOAJ
language English
format Article
sources DOAJ
author M. Lučić Lavčević
P. Dubček
S. Bernstorff
M. Pavlović
L. Šilović
spellingShingle M. Lučić Lavčević
P. Dubček
S. Bernstorff
M. Pavlović
L. Šilović
A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
Journal of Nanomaterials
author_facet M. Lučić Lavčević
P. Dubček
S. Bernstorff
M. Pavlović
L. Šilović
author_sort M. Lučić Lavčević
title A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
title_short A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
title_full A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
title_fullStr A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
title_full_unstemmed A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
title_sort grazing-incidence small-angle x-ray scattering view of vertically aligned zno nanowires
publisher Hindawi Limited
series Journal of Nanomaterials
issn 1687-4110
1687-4129
publishDate 2013-01-01
description We report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nanowires, grown through a hydrothermal growth process on nanostructured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively. The comparison of the scattering patterns of seeding coatings and nanowires showed that the scattering of vertically aligned nanowires exhibited a specific feature: the dominant characteristic of their scattering patterns is the appearance of fine structure effects around the specular peak. These effects were clarified by the combined reflection and scattering phenomena, suggested for the aligned nanowires-substrate system. Furthermore, they enabled the calculation of the average gyration radius of nanowires in horizontal direction. The calculated value was in good agreement with the radii of nanowires estimated by surface electron microscopy. Therefore, the observed feature in the scattering pattern can serve as evidence of the aligned growth of nanowires.
url http://dx.doi.org/10.1155/2013/381519
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