Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs

This paper presents the effects of optical radiation on the behavior of two scaled-gate aluminum gallium nitride/gallium nitride (AlGaN/GaN) high electron mobility transistors (HEMTs). The tested devices, having a gate width of 100 and 200 µm and a gate length of 0.25 µm, were expo...

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Bibliographic Details
Main Authors: Alina Caddemi, Emanuele Cardillo, Salvatore Patanè, Claudia Triolo
Format: Article
Language:English
Published: MDPI AG 2019-06-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/8/6/698
Description
Summary:This paper presents the effects of optical radiation on the behavior of two scaled-gate aluminum gallium nitride/gallium nitride (AlGaN/GaN) high electron mobility transistors (HEMTs). The tested devices, having a gate width of 100 and 200 µm and a gate length of 0.25 µm, were exposed to a laser beam with a wavelength of 404 nm (blue-ray) in order to investigate the main optical effects on the DC characteristics. Owing to the threshold shift and the charge generation, a marked increase of the gate and drain current was noticed. The occurrence of the kink effect in the absence of light exposure was identified, and a hypothesis about its origin is provided. The obtained results agree with the analysis previously carried out on gallium arsenide (GaAs)-based devices.
ISSN:2079-9292