Accurate Calibration and Uncertainty Estimation of the Normal Spring Constant of Various AFM Cantilevers
Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical properties of materials in the biophysics and nanomechanical fields. The atomic force microscope (AFM) is widely used in microforce measurement. The cantilever probe works as an AFM force sensor, and the...
Main Authors: | Yunpeng Song, Sen Wu, Linyan Xu, Xing Fu |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2015-03-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/15/3/5865 |
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