Improvement of Switching Speed of a 600-V Nonpunch-Through Insulated Gate Bipolar Transistor Using Fast Neutron Irradiation
Fast neutron irradiation was used to improve the switching speed of a 600-V nonpunch-through insulated gate bipolar transistor. Fast neutron irradiation was carried out at 30-MeV energy in doses of 1 × 108 n/cm2, 1 × 109 n/cm2, 1 × 1010 n/cm2, and 1 × 1011 n/cm2. Electrical characteristics such as c...
Main Authors: | Ha Ni Baek, Gwang Min Sun, Ji suck Kim, Sy Minh Tuan Hoang, Mi Eun Jin, Sung Ho Ahn |
---|---|
Format: | Article |
Language: | English |
Published: |
Elsevier
2017-02-01
|
Series: | Nuclear Engineering and Technology |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S1738573316301930 |
Similar Items
-
Design, Simulation and Modeling of Insulated Gate Bipolar Transistor
by: Gupta, Kaustubh
Published: (2013) -
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor
by: Xiangxiang Liu, et al.
Published: (2020-01-01) -
Progress Toward a Redetermination of the Neutron Lifetime Through the Absolute Determination of Neutron Flux
by: Yue, Andrew T
Published: (2011) -
Measurements of the Neutron Lifetime
by: F. E. Wietfeldt
Published: (2018-12-01) -
Simulation Study of an Insulated Gate Bipolar Transistor With Pinched-Off N-Type Pillar
by: Mengxuan Jiang, et al.
Published: (2016-01-01)