Resonant soft X-ray reflectivity of ultrathin polymer films at the C-edge: A direct approach
The use of resonant soft X-ray reflectivity (RSXRR) in s-polarization is presented with the aim to show how far it is possible to go in the understanding the evolution of the refractive index n(E)=1−δ(E)−iβ(E) of a ultrathin polystyrene film when the RSXRR is measured through the C-edge. We evidence...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2016-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4963295 |