Wang, X., Mao, S., Zhang, J., Li, Z., Deng, Q., Ning, J., . . . Han, X. (2017). MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. MDPI AG.
Chicago Style (17th ed.) CitationWang, Xiaodong, et al. MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. MDPI AG, 2017.
MLA (8th ed.) CitationWang, Xiaodong, et al. MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. MDPI AG, 2017.
Warning: These citations may not always be 100% accurate.