Inverse Scattering Analysis from Measurement Data of Total Electric and Magnetic Fields by Means of Cylindrical-Wave Expansion

• Main Authors: Tomonori Tsuburaya, Zhiqi Meng, Takashi Takenaka
• Format: Article
• Language: English
• Published: MDPI AG 2019-04-01
• Series: Electronics
• Subjects: incident field; inverse scattering; total field data; unwanted obstacles and waves
• Online Access: https://www.mdpi.com/2079-9292/8/4/417

Microwave tomography is an effective technique to estimate material distribution, where inverse scattering analysis is performed on the assumption that accurate information on the incident field is known for a measurement curve as well as in the target region. In reality, however, the information may often be unobtainable due to multiple scattering between the transmitting antenna and the target object, or existence of unwanted waves and obstacles. In this paper, a method to extract information on incident fields from measured total field data is proposed. The validity of the proposed method is verified on 2D TM<i>_z</i> problems, where a cylindrical, a square, and an L-shape homogeneous object are employed as a target object. Furthermore, it is shown that the method is available even when there are unwanted obstacles outside the measurement curve.