Temperature-Driven Spin Reorientation Transition in CoPt/AlN Multilayer Films

Temperature-Driven Spin Reorientation Transition in CoPt/AlN Multilayer Films

Spin reorientation transition phenomena from out-of-plane to in-plane direction with increasing temperature are observed for the 500°C annealed CoPt/AlN multilayer films with different CoPt layer thicknesses. CoPt-AlN interface and volume anisotropy contributions, favoring out-of-plane and in-plane...

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Bibliographic Details
Main Authors: Wupeng Cai, Shinji Muraishi, Ji Shi, Yoshio Nakamura, Wei Liu, Ronghai Yu
Format: Article
Language:English
Published: Hindawi Limited 2012-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2012/814162

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