Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon
Boron pile-up at the maximum melt depth for laser melt annealing of implanted silicon has been reported in numerous papers. The present contribution examines the boron accumulation in a laser doping setting, without dopants initially incorporated in the silicon wafer. Our numerical simulation models...
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-02-01
|
Series: | Materials |
Subjects: | |
Online Access: | http://www.mdpi.com/1996-1944/10/2/189 |
id |
doaj-a2c3bc767b5b4f1e848e18587dbed23f |
---|---|
record_format |
Article |
spelling |
doaj-a2c3bc767b5b4f1e848e18587dbed23f2020-11-24T23:03:46ZengMDPI AGMaterials1996-19442017-02-0110218910.3390/ma10020189ma10020189Boron Partitioning Coefficient above Unity in Laser Crystallized SiliconPatrick C. Lill0Morris Dahlinger1Jürgen R. Köhler2Institute for Photovoltaics and Research Center SCoPE, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, GermanyInstitute for Photovoltaics and Research Center SCoPE, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, GermanyInstitute for Photovoltaics and Research Center SCoPE, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, GermanyBoron pile-up at the maximum melt depth for laser melt annealing of implanted silicon has been reported in numerous papers. The present contribution examines the boron accumulation in a laser doping setting, without dopants initially incorporated in the silicon wafer. Our numerical simulation models laser-induced melting as well as dopant diffusion, and excellently reproduces the secondary ion mass spectroscopy-measured boron profiles. We determine a partitioning coefficient k p above unity with k p = 1 . 25 ± 0 . 05 and thermally-activated diffusivity D B , with a value D B ( 1687 K ) = ( 3 . 53 ± 0 . 44 ) × 10 − 4 cm 2 ·s − 1 of boron in liquid silicon. For similar laser parameters and process conditions, our model predicts the anticipated boron profile of a laser doping experiment.http://www.mdpi.com/1996-1944/10/2/189solute trappingrapid solidificationsiliconlaser meltingboron doping |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Patrick C. Lill Morris Dahlinger Jürgen R. Köhler |
spellingShingle |
Patrick C. Lill Morris Dahlinger Jürgen R. Köhler Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon Materials solute trapping rapid solidification silicon laser melting boron doping |
author_facet |
Patrick C. Lill Morris Dahlinger Jürgen R. Köhler |
author_sort |
Patrick C. Lill |
title |
Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon |
title_short |
Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon |
title_full |
Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon |
title_fullStr |
Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon |
title_full_unstemmed |
Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon |
title_sort |
boron partitioning coefficient above unity in laser crystallized silicon |
publisher |
MDPI AG |
series |
Materials |
issn |
1996-1944 |
publishDate |
2017-02-01 |
description |
Boron pile-up at the maximum melt depth for laser melt annealing of implanted silicon has been reported in numerous papers. The present contribution examines the boron accumulation in a laser doping setting, without dopants initially incorporated in the silicon wafer. Our numerical simulation models laser-induced melting as well as dopant diffusion, and excellently reproduces the secondary ion mass spectroscopy-measured boron profiles. We determine a partitioning coefficient k p above unity with k p = 1 . 25 ± 0 . 05 and thermally-activated diffusivity D B , with a value D B ( 1687 K ) = ( 3 . 53 ± 0 . 44 ) × 10 − 4 cm 2 ·s − 1 of boron in liquid silicon. For similar laser parameters and process conditions, our model predicts the anticipated boron profile of a laser doping experiment. |
topic |
solute trapping rapid solidification silicon laser melting boron doping |
url |
http://www.mdpi.com/1996-1944/10/2/189 |
work_keys_str_mv |
AT patrickclill boronpartitioningcoefficientaboveunityinlasercrystallizedsilicon AT morrisdahlinger boronpartitioningcoefficientaboveunityinlasercrystallizedsilicon AT jurgenrkohler boronpartitioningcoefficientaboveunityinlasercrystallizedsilicon |
_version_ |
1725632119988813824 |