APA (7th ed.) Citation

Biswal, P., Sambho, H., & Biswas, S. (2016). A Discrete Event System approach to On-line Testing of digital circuits with measurement limitation. Elsevier.

Chicago Style (17th ed.) Citation

Biswal, P.K, H.P Sambho, and S. Biswas. A Discrete Event System Approach to On-line Testing of Digital Circuits with Measurement Limitation. Elsevier, 2016.

MLA (8th ed.) Citation

Biswal, P.K, et al. A Discrete Event System Approach to On-line Testing of Digital Circuits with Measurement Limitation. Elsevier, 2016.