Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics
Abstract Flourite-structure ferroelectrics (FEs) and antiferroelectrics (AFEs) such as HfO2 and its variants have gained copious attention from the semiconductor community, because they enable complementary metal-oxide-semiconductor (CMOS)-compatible platforms for high-density, high-performance non-...
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2021-06-01
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Online Access: | https://doi.org/10.1038/s41598-021-91492-w |
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doaj-a54ea8f3c3e94176a2b9cbf6d98f838f2021-06-20T11:34:30ZengNature Publishing GroupScientific Reports2045-23222021-06-011111810.1038/s41598-021-91492-wExtraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectricsZheng Wang0Jae Hur1Nujhat Tasneem2Winston Chern3Shimeng Yu4Asif Khan5Georgia Institute of Technology, School of Electrical and Computer EngineeringGeorgia Institute of Technology, School of Electrical and Computer EngineeringGeorgia Institute of Technology, School of Electrical and Computer EngineeringDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of TechnologyGeorgia Institute of Technology, School of Electrical and Computer EngineeringGeorgia Institute of Technology, School of Electrical and Computer EngineeringAbstract Flourite-structure ferroelectrics (FEs) and antiferroelectrics (AFEs) such as HfO2 and its variants have gained copious attention from the semiconductor community, because they enable complementary metal-oxide-semiconductor (CMOS)-compatible platforms for high-density, high-performance non-volatile and volatile memory technologies. While many individual experiments have been conducted to characterize and understand fluorite-structure FEs and AFEs, there has been little effort to aggregate the information needed to benchmark and provide insights into their properties. We present a fast and robust modeling framework that automatically fits the Preisach model to the experimental polarization ( $$Q_{FE}$$ Q FE ) versus electric field ( $$E_{FE}$$ E FE ) hysteresis characterizations of fluorite-structure FEs. The modifications to the original Preisach model allow the double hysteresis loops in fluorite-structure antiferroelectrics to be captured as well. By fitting the measured data reported in the literature, we observe that ferroelectric polarization and dielectric constant decrease as the coercive field rises in general.https://doi.org/10.1038/s41598-021-91492-w |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Zheng Wang Jae Hur Nujhat Tasneem Winston Chern Shimeng Yu Asif Khan |
spellingShingle |
Zheng Wang Jae Hur Nujhat Tasneem Winston Chern Shimeng Yu Asif Khan Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics Scientific Reports |
author_facet |
Zheng Wang Jae Hur Nujhat Tasneem Winston Chern Shimeng Yu Asif Khan |
author_sort |
Zheng Wang |
title |
Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
title_short |
Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
title_full |
Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
title_fullStr |
Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
title_full_unstemmed |
Extraction of Preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
title_sort |
extraction of preisach model parameters for fluorite-structure ferroelectrics and antiferroelectrics |
publisher |
Nature Publishing Group |
series |
Scientific Reports |
issn |
2045-2322 |
publishDate |
2021-06-01 |
description |
Abstract Flourite-structure ferroelectrics (FEs) and antiferroelectrics (AFEs) such as HfO2 and its variants have gained copious attention from the semiconductor community, because they enable complementary metal-oxide-semiconductor (CMOS)-compatible platforms for high-density, high-performance non-volatile and volatile memory technologies. While many individual experiments have been conducted to characterize and understand fluorite-structure FEs and AFEs, there has been little effort to aggregate the information needed to benchmark and provide insights into their properties. We present a fast and robust modeling framework that automatically fits the Preisach model to the experimental polarization ( $$Q_{FE}$$ Q FE ) versus electric field ( $$E_{FE}$$ E FE ) hysteresis characterizations of fluorite-structure FEs. The modifications to the original Preisach model allow the double hysteresis loops in fluorite-structure antiferroelectrics to be captured as well. By fitting the measured data reported in the literature, we observe that ferroelectric polarization and dielectric constant decrease as the coercive field rises in general. |
url |
https://doi.org/10.1038/s41598-021-91492-w |
work_keys_str_mv |
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