In Situ Creep Behavior Characterization of Single Crystal Superalloy by UV-DIC at 980 °C

In Situ Creep Behavior Characterization of Single Crystal Superalloy by UV-DIC at 980 °C

High temperature creep resistance is a critical characteristic of Ni-based single crystal (SX) superalloys. In this work, the creep behavior of a Ni-based SX superalloy was in situ characterized at 980 °C by ultraviolet (UV) imaging combined two-dimensional digital image correlation (DIC) i...

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Bibliographic Details
Main Authors: Yong Shang, Yali Dong, Yanling Pei, Chaoli Ma, Shusuo Li, Shengkai Gong
Format: Article
Language:English
Published: MDPI AG 2019-09-01
Series:Coatings
Subjects:
digital image correlation
UV imaging
DIC
deformation
creep behavior
single-crystal superalloy
Online Access:https://www.mdpi.com/2079-6412/9/10/598

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