A new method of carrier density measurement using photocurrent maps of a 2D material Schottky diode

A new method of carrier density measurement using photocurrent maps of a 2D material Schottky diode

A simple method for obtaining the charge carrier density of two-dimensional (2D) materials is proposed herein. A formula is suggested for the extraction of the 2D charge carrier density using the horizontal depletion width, which is visually represented by photocurrent mapping methods. An example of...

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Bibliographic Details
Main Authors: Il-Ho Ahn, Jongtae Ahn, Do Kyung Hwang, Deuk Young Kim
Format: Article
Language:English
Published: Elsevier 2021-02-01
Series:Results in Physics
Subjects:
Carrier concentration
Photocurrent mapping method
Online Access:http://www.sciencedirect.com/science/article/pii/S2211379721000383
Description
Summary:A simple method for obtaining the charge carrier density of two-dimensional (2D) materials is proposed herein. A formula is suggested for the extraction of the 2D charge carrier density using the horizontal depletion width, which is visually represented by photocurrent mapping methods. An example of this method is demonstrated using a MoS2 Schottky diode. The results suggest that this method can be useful for a basic analysis of the physical properties of 2D devices.
ISSN:2211-3797

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