Single-defect spectroscopy in the shortwave infrared
Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2019-06-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-019-10788-8 |
| Summary: | Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at the single defect level. |
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| ISSN: | 2041-1723 |