SIMULATION OF STATIC AND DYNAMIC LOSSES IN MOSFET KEYS
Issues of modeling of losses in MOSFET keys from the Electronics Workbench (EWB) program library as well as optimization of the power key operation mode are considered. A number of important facts have been obtained by using the EWB program of circuit simulation, which should be taken into account w...
Main Authors: | V. P. Babenko, V. K. Bityukov, V. V. Kuznetsov, D. S. Simachkov |
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Format: | Article |
Language: | Russian |
Published: |
MIREA - Russian Technological University
2018-02-01
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Series: | Российский технологический журнал |
Subjects: | |
Online Access: | https://www.rtj-mirea.ru/jour/article/view/98 |
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