Evaluation of Degradation in Nanofilled Adhesive Resins Using Quantitative Light-Induced Fluorescence

• Main Authors: Tae-Young Park, Sun-Jae Kim, Hee-Jung Kim, Byoung-Jin Lee, Byung-Hoon Kim, Yeong-Mu Ko, Jeong-Bum Min
• Format: Article
• Language: English
• Published: Hindawi Limited 2014-01-01
• Series: Journal of Nanomaterials
• Online Access: http://dx.doi.org/10.1155/2014/671205

The aim of this study was to evaluate degradation in commercial dental nanofilled adhesive resins using quantitative light-induced fluorescence (QLF). Three adhesives were selected: D/E resin (DR), Single Bond Plus (SB), and G-Bond (GB). The adhesives were mixed with porphyrin for the QLF analysis. Specimens were prepared by dispensing blended adhesives into a flexible mold and polymerizing. Then, the QLF analysis of the specimens was done and the porphyrin values (Simple Plaque Score and ΔR) were measured. After thermocycling of the specimens (5000 cycles, 5 to 55°C) for the degradation, the specimens were assayed by QLF again. The porphyrin values were analyzed using paired t-test at a 95% confidence level. A significant reduction in SPS was observed in all groups after thermocycling. The ΔR significantly decreased after thermocycling except area ΔR30 of SB group. Overall, porphyrin values decreased after thermocycling which indicates that the degradation of the adhesive resins may be measured by the change of porphyrin value. The QLF method could be used to evaluate the degradation of adhesive resin.