High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering

High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering

High-quality single-crystal thulium iron garnet (TmIG) films of 10-30 nm thick were grown by off-axis sputtering at room temperature (RT) followed by post-annealing. X-ray photoelectron spectroscopy (XPS) was employed to determine the TmIG film composition to optimize the growth conditions, along wi...

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Main Authors: C. N. Wu, C. C. Tseng, K. Y. Lin, C. K. Cheng, S. L. Yeh, Y. T. Fanchiang, M. Hong, J. Kwo
Format: Article
Language:English
Published: AIP Publishing LLC 2018-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5006673
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spelling doaj-ad3d3fa68bfe4e7782ace7c9e6531b942020-11-25T00:26:16ZengAIP Publishing LLCAIP Advances2158-32262018-05-0185055904055904-610.1063/1.5006673086891ADVHigh-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputteringC. N. Wu0C. C. Tseng1K. Y. Lin2C. K. Cheng3S. L. Yeh4Y. T. Fanchiang5M. Hong6J. Kwo7Department of Physics, National Tsing Hua University, Hsinchu 30013, TaiwanDepartment of Physics, National Tsing Hua University, Hsinchu 30013, TaiwanGraduate Institute of Applied Physics and Department of Physics, National Taiwan University, Taipei 10617, TaiwanGraduate Institute of Applied Physics and Department of Physics, National Taiwan University, Taipei 10617, TaiwanDepartment of Physics, National Tsing Hua University, Hsinchu 30013, TaiwanGraduate Institute of Applied Physics and Department of Physics, National Taiwan University, Taipei 10617, TaiwanGraduate Institute of Applied Physics and Department of Physics, National Taiwan University, Taipei 10617, TaiwanDepartment of Physics, National Tsing Hua University, Hsinchu 30013, TaiwanHigh-quality single-crystal thulium iron garnet (TmIG) films of 10-30 nm thick were grown by off-axis sputtering at room temperature (RT) followed by post-annealing. X-ray photoelectron spectroscopy (XPS) was employed to determine the TmIG film composition to optimize the growth conditions, along with the aid of x-ray diffraction (XRD) structural analysis and atomic force microscope (AFM) for surface morphology. The optimized films exhibited perpendicular magnetic anisotropy (PMA) and the saturation magnetization at RT was ∼99 emu/cm3, close to the RT bulk value ∼110 emu/cm3 with a very low coercive field of ∼2.4 Oe. We extracted the H⊥ of 1734 Oe and the peak-to-peak linewidth ΔH of ferromagnetic resonance are only about 99 Oe, significantly lower than that of PLD grown TmIG film and bulk single crystals. The high-quality sputtered single-crystal TmIG films show great potential to be integrated with topological insulators or heavy metals with strong spin-orbit coupling for spintronic applications.http://dx.doi.org/10.1063/1.5006673
collection DOAJ
language English
format Article
sources DOAJ
author C. N. Wu
C. C. Tseng
K. Y. Lin
C. K. Cheng
S. L. Yeh
Y. T. Fanchiang
M. Hong
J. Kwo
spellingShingle C. N. Wu
C. C. Tseng
K. Y. Lin
C. K. Cheng
S. L. Yeh
Y. T. Fanchiang
M. Hong
J. Kwo
High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
AIP Advances
author_facet C. N. Wu
C. C. Tseng
K. Y. Lin
C. K. Cheng
S. L. Yeh
Y. T. Fanchiang
M. Hong
J. Kwo
author_sort C. N. Wu
title High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
title_short High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
title_full High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
title_fullStr High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
title_full_unstemmed High-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
title_sort high-quality single-crystal thulium iron garnet films with perpendicular magnetic anisotropy by off-axis sputtering
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2018-05-01
description High-quality single-crystal thulium iron garnet (TmIG) films of 10-30 nm thick were grown by off-axis sputtering at room temperature (RT) followed by post-annealing. X-ray photoelectron spectroscopy (XPS) was employed to determine the TmIG film composition to optimize the growth conditions, along with the aid of x-ray diffraction (XRD) structural analysis and atomic force microscope (AFM) for surface morphology. The optimized films exhibited perpendicular magnetic anisotropy (PMA) and the saturation magnetization at RT was ∼99 emu/cm3, close to the RT bulk value ∼110 emu/cm3 with a very low coercive field of ∼2.4 Oe. We extracted the H⊥ of 1734 Oe and the peak-to-peak linewidth ΔH of ferromagnetic resonance are only about 99 Oe, significantly lower than that of PLD grown TmIG film and bulk single crystals. The high-quality sputtered single-crystal TmIG films show great potential to be integrated with topological insulators or heavy metals with strong spin-orbit coupling for spintronic applications.
url http://dx.doi.org/10.1063/1.5006673
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