Physics Based Degradation Models for Capacitor Prognostics under Thermal Overstress Conditions

Physics Based Degradation Models for Capacitor Prognostics under Thermal Overstress Conditions

Electronics subsystems for monitoring, control, and enhanced functionality play an increasingly important role in safety critical systems. Electrolytic capacitors are an important component in several key subsystems that range from power supplies on safety critical avionics equipment to power driver...

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Bibliographic Details
Main Authors:	Kai Goebel, Gautam Biswas, Jose R. Celaya, Chetan S. Kulkarni
Format:	Article
Language:	English
Published:	The Prognostics and Health Management Society 2013-01-01
Series:	International Journal of Prognostics and Health Management
Subjects:	electronics PHM Capacitors Physics-based degradation models Capacitance Accelerated aging Thermal Overstress
Online Access:	http://www.phmsociety.org/sites/phmsociety.org/files/phm_submission/2012/ijphm_13_005.pdf

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