Physical, chemical, and optical data of SnS layers and light switching frequency dependent photoresponses

• Main Authors: Malkeshkumar Patel, Hong-Sik Kim, Joondong Kim
• Format: Article
• Language: English
• Published: Elsevier 2017-10-01
• Series: Data in Brief
• Subjects: SnS; Vertical growth; Photodetectors; 2D materials; Waferscale
• Online Access: http://www.sciencedirect.com/science/article/pii/S235234091730358X

In this data article, vertically grown SnS layers were investigated. The growth processes of vertical SnS layers were discussed in our article [1]. This data article provides the chemical analysis using the XPS measurements for the SnS sample grown on a Si wafer. Deposition time varying SnS morphology changes were observed by FESEM. The cross-sectional images were achieved to monitor the SnS layer thickness. Refractive index of the grown SnS film was calculated using the reflectance data. A self-operating photoelectric was realized with structuring of SnS layers on the n-type Si wafer. Transient photoresponses were achieved by tuning the switching frequencies.