Application of Magnetic Force Microscopy for Investigation of Epitaxial Ferro- and Antiferromagnetic Structures

• Main Authors: Gennady M. Mikhailov, Anatoliy V. Chernykh, Lev A. Fomin
• Format: Article
• Language: English
• Published: MDPI AG 2017-10-01
• Series: Materials
• Subjects: exchange bias; magnetic force microscopy; epitaxial microstructures; Fe; FeMn
• Online Access: https://www.mdpi.com/1996-1944/10/10/1156

Growing of epitaxial Fe50Mn50/Fe/Mo/R-sapphire films was performed with a new configuration of two in-plane easy axes of Fe(001)-layer magnetization in which application of annealing in a magnetic field forms an unidirectional anisotropy. The microstructures made from these films exhibited an exchange bias 25–35 G along an exchange field generated at antiferromagnet/ferromagnet (AFM/FM) interface. Magnetic force microscopy (MFM) experiments supported by micromagnetic calculations and magneto-resistive measurements allowed interpretation of the magnetic states of the Fe layer in these microstructures. The magnetic states of the iron layer are influenced more by crystallographic anisotropy of the Fe-layer than by unidirectional exchange anisotropy.