A metallography and x-ray tomography study of spall damage in ultrapure Al

We characterize spall damage in shock-recovered ultrapure Al with metallography and x-ray tomography. The measured damage profiles in ultrapure Al induced by planar impact at different shock strengths, can be described with a Gaussian function, and showed dependence on shock strengths. Optical metal...

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Main Authors: M. L. Qi, B. X. Bie, F. P. Zhao, C. M. Hu, D. Fan, X. X. Ran, X. H. Xiao, W. G. Yang, P. Li, S. N. Luo
Format: Article
Language:English
Published: AIP Publishing LLC 2014-07-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4890310
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spelling doaj-b4c84e251a114e7ba060318d25a7a5d32020-11-25T02:16:54ZengAIP Publishing LLCAIP Advances2158-32262014-07-0147077118077118-1210.1063/1.4890310015407ADVA metallography and x-ray tomography study of spall damage in ultrapure AlM. L. Qi0B. X. Bie1F. P. Zhao2C. M. Hu3D. Fan4X. X. Ran5X. H. Xiao6W. G. Yang7P. Li8S. N. Luo9School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, P. R. ChinaSchool of Science, Wuhan University of Technology, Wuhan, Hubei 430070, P. R. ChinaThe Peac Institute of Multiscale Sciences and Sichuan University, Chengdu, Sichuan 610207, P. R. ChinaHPSynC@Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USAThe Peac Institute of Multiscale Sciences and Sichuan University, Chengdu, Sichuan 610207, P. R. ChinaSchool of Science, Wuhan University of Technology, Wuhan, Hubei 430070, P. R. ChinaAdvanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USAHPSynC@Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USANational Key Laboratory of Shock Wave and Detonation Physics, Chinese Academy of Engineering Physics, Mianyang, Sichuan 621900, P. R. ChinaThe Peac Institute of Multiscale Sciences and Sichuan University, Chengdu, Sichuan 610207, P. R. ChinaWe characterize spall damage in shock-recovered ultrapure Al with metallography and x-ray tomography. The measured damage profiles in ultrapure Al induced by planar impact at different shock strengths, can be described with a Gaussian function, and showed dependence on shock strengths. Optical metallography is reasonably accurate for damage profile measurements, and agrees within 10–25% with x-ray tomography. Full tomography analysis showed that void size distributions followed a power law with an exponent of γ = 1.5 ± 2.0, which is likely due to void nucleation and growth, and the exponent is considerably smaller than the predictions from percolation models.http://dx.doi.org/10.1063/1.4890310
collection DOAJ
language English
format Article
sources DOAJ
author M. L. Qi
B. X. Bie
F. P. Zhao
C. M. Hu
D. Fan
X. X. Ran
X. H. Xiao
W. G. Yang
P. Li
S. N. Luo
spellingShingle M. L. Qi
B. X. Bie
F. P. Zhao
C. M. Hu
D. Fan
X. X. Ran
X. H. Xiao
W. G. Yang
P. Li
S. N. Luo
A metallography and x-ray tomography study of spall damage in ultrapure Al
AIP Advances
author_facet M. L. Qi
B. X. Bie
F. P. Zhao
C. M. Hu
D. Fan
X. X. Ran
X. H. Xiao
W. G. Yang
P. Li
S. N. Luo
author_sort M. L. Qi
title A metallography and x-ray tomography study of spall damage in ultrapure Al
title_short A metallography and x-ray tomography study of spall damage in ultrapure Al
title_full A metallography and x-ray tomography study of spall damage in ultrapure Al
title_fullStr A metallography and x-ray tomography study of spall damage in ultrapure Al
title_full_unstemmed A metallography and x-ray tomography study of spall damage in ultrapure Al
title_sort metallography and x-ray tomography study of spall damage in ultrapure al
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2014-07-01
description We characterize spall damage in shock-recovered ultrapure Al with metallography and x-ray tomography. The measured damage profiles in ultrapure Al induced by planar impact at different shock strengths, can be described with a Gaussian function, and showed dependence on shock strengths. Optical metallography is reasonably accurate for damage profile measurements, and agrees within 10–25% with x-ray tomography. Full tomography analysis showed that void size distributions followed a power law with an exponent of γ = 1.5 ± 2.0, which is likely due to void nucleation and growth, and the exponent is considerably smaller than the predictions from percolation models.
url http://dx.doi.org/10.1063/1.4890310
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