TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS
Construction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system aut...
Main Authors: | V. L. Kozlov, M. M. Kygeiko |
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Format: | Article |
Language: | English |
Published: |
Belarusian National Technical University
2015-04-01
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Series: | Pribory i Metody Izmerenij |
Subjects: | |
Online Access: | https://pimi.bntu.by/jour/article/view/132 |
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