TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS

Construction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system aut...

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Bibliographic Details
Main Authors: V. L. Kozlov, M. M. Kygeiko
Format: Article
Language:English
Published: Belarusian National Technical University 2015-04-01
Series:Pribory i Metody Izmerenij
Subjects:
Online Access:https://pimi.bntu.by/jour/article/view/132

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